dc.contributor.author | .N. Maznouk, Dr.Noura | |
dc.contributor.author | .A. Almaarati, Dr.Ghiath | |
dc.contributor.author | .M.Yousef, Rafee | |
dc.date.accessioned | 2021-06-03T10:35:20Z | |
dc.date.available | 2021-06-03T10:35:20Z | |
dc.date.issued | 2020-07 | |
dc.identifier.issn | 2518-5845 | |
dc.identifier.uri | http://repository.uob.edu.ly/handle/123456789/1559 | |
dc.description.abstract | * In this research we have formed a circuit to exam the transistors of the types npn and pnp and detect the transistors that work from the damage . * We used the formation of this circuit on the basic component is the 555 timer , and we used several other pieces of electronic will come to mention later. * We tested many transistors by the previous circuit. | en_US |
dc.language.iso | other | en_US |
dc.publisher | university of Benghazi - Faculty of education almarj | en_US |
dc.relation.ispartofseries | Global Libyan Journal;48 | |
dc.subject | The 555 Timer | en_US |
dc.subject | AStable | en_US |
dc.subject | Transistor | en_US |
dc.subject | Operational amplifier | en_US |
dc.subject | Comparator | en_US |
dc.subject | Optical LEDs. | en_US |
dc.title | Forming a transistor test circuit by using 555 timer | en_US |
dc.type | Working Paper | en_US |