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Forming a transistor test circuit by using 555 timer

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dc.contributor.author .N. Maznouk, Dr.Noura
dc.contributor.author .A. Almaarati, Dr.Ghiath
dc.contributor.author .M.Yousef, Rafee
dc.date.accessioned 2021-06-03T10:35:20Z
dc.date.available 2021-06-03T10:35:20Z
dc.date.issued 2020-07
dc.identifier.issn 2518-5845
dc.identifier.uri http://repository.uob.edu.ly/handle/123456789/1559
dc.description.abstract * In this research we have formed a circuit to exam the transistors of the types npn and pnp and detect the transistors that work from the damage . * We used the formation of this circuit on the basic component is the 555 timer , and we used several other pieces of electronic will come to mention later. * We tested many transistors by the previous circuit. en_US
dc.language.iso other en_US
dc.publisher university of Benghazi - Faculty of education almarj en_US
dc.relation.ispartofseries Global Libyan Journal;48
dc.subject The 555 Timer en_US
dc.subject AStable en_US
dc.subject Transistor en_US
dc.subject Operational amplifier en_US
dc.subject Comparator en_US
dc.subject Optical LEDs. en_US
dc.title Forming a transistor test circuit by using 555 timer en_US
dc.type Working Paper en_US

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